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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/18519
Type: conferenceObject
Title: Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells
Author(s): PEREZ, Z.
MESALLES, JAVIER
VILLACORTA, H.
Fabian Luis Vargas
CHAMPAC, VICTOR
In: 2020 IEEE Latin-American Test Symposium (LATS), 2020, Estados Unidos.
Issue Date: 2020
URI: https://hdl.handle.net/10923/18519
DOI: DOI:10.1109/LATS49555.2020.9093680
ISBN: 9781728187310
Appears in Collections:Apresentação em Evento

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