| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | PEREZ, Z. | - |
| dc.contributor.author | MESALLES, JAVIER | - |
| dc.contributor.author | VILLACORTA, H. | - |
| dc.contributor.author | Fabian Luis Vargas | - |
| dc.contributor.author | CHAMPAC, VICTOR | - |
| dc.date.accessioned | 2021-09-24T20:49:13Z | - |
| dc.date.available | 2021-09-24T20:49:13Z | - |
| dc.date.issued | 2020 | - |
| dc.identifier.isbn | 9781728187310 | - |
| dc.identifier.uri | https://hdl.handle.net/10923/18519 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | 2020 IEEE Latin-American Test Symposium (LATS), 2020, Estados Unidos. | - |
| dc.rights | openAccess | - |
| dc.title | Analysis and detection of hard-to-detect full open defects in FinFET based SRAM cells | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2021-09-24T20:49:11Z | - |
| dc.identifier.doi | DOI:10.1109/LATS49555.2020.9093680 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
