| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | César Augusto Missio Marcon | - |
| dc.contributor.author | Alexandre Amory | - |
| dc.contributor.author | Marcelo Lubaszewski | - |
| dc.contributor.author | Altamiro Amadeu Susin | - |
| dc.contributor.author | Ney Laert Vilar Calazans | - |
| dc.contributor.author | Fernando Gehm Moraes | - |
| dc.contributor.author | Fabiano Passuelo Hessel | - |
| dc.date.accessioned | 2022-11-18T14:34:15Z | - |
| dc.date.available | 2022-11-18T14:34:15Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.uri | https://hdl.handle.net/10923/23439 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | 5th IEEE Latin-American Test Workshop, 2004, Colômbia. | - |
| dc.rights | openAccess | - |
| dc.title | Applying Memory Test to Embedded Systems | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2022-11-18T14:34:14Z | - |
| Aparece en las colecciones: | Apresentação em Evento
|
