Structural Characterization of Doped GaSb Single Crystals by X-ray Topography

Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/22334

Type:	Article
Title:	Structural Characterization of Doped GaSb Single Crystals by X-ray Topography
Author(s):	Hönnicke, M. G. Mazzaro, I. Manica, J. Benine, E. Eleani Maria da Costa Berenice Anina Dedavid Cusatis, C. Huang, X. R.
In:	Journal of Electronic Materials
Issue Date:	2010
Volume:	39
Issue:	6
First page:	727
Last page:	731
Keywords:	X-ray image x-ray topography Lang topography double-crystal topography
URI:	https://hdl.handle.net/10923/22334
DOI:	DOI:10.1007/s11664-010-1154-z
ISSN:	0361-5235
Appears in Collections:	Artigo de Periódico

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