| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | Hönnicke, M. G. | - |
| dc.contributor.author | Mazzaro, I. | - |
| dc.contributor.author | Manica, J. | - |
| dc.contributor.author | Benine, E. | - |
| dc.contributor.author | Eleani Maria da Costa | - |
| dc.contributor.author | Berenice Anina Dedavid | - |
| dc.contributor.author | Cusatis, C. | - |
| dc.contributor.author | Huang, X. R. | - |
| dc.date.accessioned | 2022-07-06T17:33:52Z | - |
| dc.date.available | 2022-07-06T17:33:52Z | - |
| dc.date.issued | 2010 | - |
| dc.identifier.issn | 0361-5235 | - |
| dc.identifier.uri | https://hdl.handle.net/10923/22334 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | Journal of Electronic Materials | - |
| dc.rights | openAccess | - |
| dc.subject | X-ray image | - |
| dc.subject | x-ray topography | - |
| dc.subject | Lang topography | - |
| dc.subject | double-crystal topography | - |
| dc.title | Structural Characterization of Doped GaSb Single Crystals by X-ray Topography | - |
| dc.type | Article | - |
| dc.date.updated | 2022-07-06T17:33:51Z | - |
| dc.identifier.doi | DOI:10.1007/s11664-010-1154-z | - |
| dc.jtitle | Journal of Electronic Materials | - |
| dc.volume | 39 | - |
| dc.issue | 6 | - |
| dc.spage | 727 | - |
| dc.epage | 731 | - |
| Aparece nas Coleções: | Artigo de Periódico
|
