Please use this identifier to cite or link to this item:
https://hdl.handle.net/10923/12197
| Type: | conferenceObject |
| Title: | Analysis of single-event upsets in a Microsemi ProAsic3E FPGA |
| Author(s): | VILLA, PAULO R. C.
GOERL, ROGER C.
Fabian Luis Vargas
POEHLS, LETICIA B.
MEDINA, NILBERTO H.
ADDED, NEMITALA
DE AGUIAR, VITOR A. P.
MACCHIONE, EDUARDO L. A.
AGUIRRE, FERNANDO
DA SILVEIRA, MARCILEI A. G.
BEZERRA, EDUARDO A. |
| In: | 2017 18th IEEE Latin American Test Symposium (LATS), 2017, Estados Unidos. |
| Issue Date: | 2017 |
| URI: | http://hdl.handle.net/10923/12197 |
| DOI: | DOI:10.1109/latw.2017.7906772 |
| ISBN: | 9781538604151 |
| Appears in Collections: | Apresentação em Evento
|
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