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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/23362
Type: Article
Title: An Extensible Code for Correcting Multiple Cell Upset in Memory Arrays
Author(s): SILVA, FELIPE
SILVEIRA, JARDEL
SILVEIRA, JARBAS
César Augusto Missio Marcon
VARGAS, FABIAN
LIMA, OTÁVIO
In: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
Issue Date: 2018
Volume: 34
Issue: 4
First page: 417
Last page: 433
URI: https://hdl.handle.net/10923/23362
DOI: DOI:10.1007/s10836-018-5738-5
ISSN: 0923-8174
Appears in Collections:Artigo de Periódico

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