| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | Juliano Benfica | - |
| dc.contributor.author | Fabian Luis Vargas | - |
| dc.contributor.author | Matheus Fay Soares | - |
| dc.contributor.author | Dorian Schramm | - |
| dc.date.accessioned | 2021-09-24T21:02:25Z | - |
| dc.date.available | 2021-09-24T21:02:25Z | - |
| dc.date.issued | 2020 | - |
| dc.identifier.issn | 0026-2714 | - |
| dc.identifier.uri | https://hdl.handle.net/10923/18528 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | MICROELECTRONICS RELIABILITY | - |
| dc.rights | openAccess | - |
| dc.title | Conducted EMI susceptibility analysis of a COTS processor as function of aging | - |
| dc.type | Article | - |
| dc.date.updated | 2021-09-24T21:02:24Z | - |
| dc.identifier.doi | DOI:10.1016/j.microrel.2020.113884 | - |
| dc.jtitle | MICROELECTRONICS RELIABILITY | - |
| dc.issue | 1 | - |
| dc.spage | 113884 | - |
| dc.epage | 1 | - |
| Aparece en las colecciones: | Artigo de Periódico
|
