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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/12193
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dc.contributor.authorMEDEIROS, G. CARDOSO-
dc.contributor.authorPOEHLS, L. BOLZANI-
dc.contributor.authorFabian Luis Vargas-
dc.date.accessioned2018-07-19T15:03:11Z-
dc.date.available2018-07-19T15:03:11Z-
dc.date.issued2016-
dc.identifier.isbn9781467387002-
dc.identifier.urihttp://hdl.handle.net/10923/12193-
dc.language.isoen-
dc.relation.ispartof2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID), Índia.-
dc.rightsopenAccess-
dc.titleAnalyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects-
dc.typeconferenceObject-
dc.date.updated2018-07-19T15:03:10Z-
dc.identifier.doiDOI:10.1109/vlsid.2016.146-
Appears in Collections:Apresentação em Evento

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