| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | David Freitas | - |
| dc.contributor.author | César Augusto Missio Marcon | - |
| dc.contributor.author | Jarbas Silveira | - |
| dc.contributor.author | Lirida Alves de Barros Naviner | - |
| dc.contributor.author | João Mota | - |
| dc.date.accessioned | 2023-04-04T18:16:16Z | - |
| dc.date.available | 2023-04-04T18:16:16Z | - |
| dc.date.issued | 2022 | - |
| dc.identifier.issn | 0026-2714 | - |
| dc.identifier.uri | https://hdl.handle.net/10923/24030 | - |
| dc.language.iso | pt_BR | - |
| dc.relation.ispartof | MICROELECTRONICS RELIABILITY | - |
| dc.rights | openAccess | - |
| dc.title | A Survey on Two-Dimensional Error Correction Codes Applied to Fault-Tolerant Systems | - |
| dc.type | Article | - |
| dc.date.updated | 2023-04-04T18:16:15Z | - |
| dc.identifier.doi | DOI:10.1016/j.microrel.2022.114826 | - |
| dc.jtitle | MICROELECTRONICS RELIABILITY | - |
| dc.volume | 139 | - |
| dc.issue | 11482 | - |
| dc.spage | 1 | - |
| dc.epage | 16 | - |
| Aparece en las colecciones: | Artigo de Periódico
|
