| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | PONTES, J. | - |
| dc.contributor.author | Ney Laert Vilar Calazans | - |
| dc.contributor.author | Pascal Vivet | - |
| dc.date.accessioned | 2019-02-12T12:45:54Z | - |
| dc.date.available | 2019-02-12T12:45:54Z | - |
| dc.date.issued | 2012 | - |
| dc.identifier.isbn | 9781457721458 | - |
| dc.identifier.uri | http://hdl.handle.net/10923/13980 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), Alemanha. | - |
| dc.rights | openAccess | - |
| dc.subject | Single Event Upset | - |
| dc.subject | SEU | - |
| dc.subject | radiation hardening | - |
| dc.subject | soft errors | - |
| dc.title | An accurate Single Event Effect digital design flow for reliable system level design | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2019-02-12T12:45:54Z | - |
| dc.identifier.doi | DOI:10.1109/DATE.2012.6176466 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
