| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | Juliano Benfica | - |
| dc.contributor.author | GREEN, BRUNO | - |
| dc.contributor.author | PORCHER, BRUNO C. | - |
| dc.contributor.author | Letícia Maria Bolzani Pöhls | - |
| dc.contributor.author | Fabian Vargas | - |
| dc.contributor.author | MEDINA, NILBERTO H. | - |
| dc.contributor.author | ADDED, NEMITALA | - |
| dc.contributor.author | DE AGUIAR, VITOR A. P. | - |
| dc.contributor.author | MACCHIONE, EDUARDO L. A. | - |
| dc.contributor.author | AGUIRRE, FERNANDO | - |
| dc.contributor.author | DA SILVEIRA, MARCILEI A. G. | - |
| dc.date.accessioned | 2018-07-30T14:41:23Z | - |
| dc.date.available | 2018-07-30T14:41:23Z | - |
| dc.date.issued | 2016 | - |
| dc.identifier.isbn | 9781467394949 | - |
| dc.identifier.uri | http://hdl.handle.net/10923/12271 | - |
| dc.language.iso | pt_BR | - |
| dc.relation.ispartof | 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 2016, Brasil. | - |
| dc.rights | openAccess | - |
| dc.title | Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2018-07-30T14:41:22Z | - |
| dc.identifier.doi | DOI:10.1109/APEMC.2016.7522900 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
