| Campo DC | Valor | Idioma |
|---|
| dc.contributor.author | LEITE, FELIPE G. H. | - |
| dc.contributor.author | SANTOS, ROBERTO B. B. | - |
| dc.contributor.author | MEDINA, NILBERTO H. | - |
| dc.contributor.author | AGUIAR, VITOR. A. P. | - |
| dc.contributor.author | GIACOMINI, RENATO C. | - |
| dc.contributor.author | ADDED, NEMITALA | - |
| dc.contributor.author | AGUIRRE, FERNANDO | - |
| dc.contributor.author | MACCHIONE, EDUARDO L.A. | - |
| dc.contributor.author | Fabian Luis Vargas | - |
| dc.contributor.author | DA SILVEIRA, MARCILEI A. G. | - |
| dc.date.accessioned | 2018-07-19T15:07:45Z | - |
| dc.date.available | 2018-07-19T15:07:45Z | - |
| dc.date.issued | 2017 | - |
| dc.identifier.isbn | 9781538604151 | - |
| dc.identifier.uri | http://hdl.handle.net/10923/12199 | - |
| dc.language.iso | en | - |
| dc.relation.ispartof | 2017 18th IEEE Latin American Test Symposium (LATS), 2017, Estados Unidos. | - |
| dc.rights | openAccess | - |
| dc.title | Ionizing radiation effects on a COTS low-cost RISC microcontroller | - |
| dc.type | conferenceObject | - |
| dc.date.updated | 2018-07-19T15:07:45Z | - |
| dc.identifier.doi | DOI:10.1109/latw.2017.7906762 | - |
| Aparece en las colecciones: | Apresentação em Evento
|
