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Issue Date
Title
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2011
IP Core to Leverage RTOS-Based Embedded Systems Reliability
Dhiego Silva
;
Fabian Vargas
;
Letícia Maria Bolzani Pöhls
;
Jorge Semião
;
Isabel Teixeira
;
João Paulo Teixeira
;
Juan Jose Rodriguez-Andina
;
Maria Valdés
;
Judit Freijedo
2015
Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs
LAVRATTI, F.
;
Letícia Maria Bolzani Pöhls
;
Fabian Vargas
;
Andrea Calimera
;
Enrico Macii
2016
Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID
Juliano Benfica
;
GREEN, BRUNO
;
PORCHER, BRUNO C.
;
Letícia Maria Bolzani Pöhls
;
Fabian Vargas
;
MEDINA, NILBERTO H.
;
ADDED, NEMITALA
;
DE AGUIAR, VITOR A. P.
;
MACCHIONE, EDUARDO L. A.
;
AGUIRRE, FERNANDO
;
DA SILVEIRA, MARCILEI A. G.
2018
Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs
MEDEIROS, G.
;
BRUM, E.
;
Letícia Maria Bolzani Pöhls
;
Thiago Copetti
;
Tiago Balen
2017
Analyzing the behavior of FinFET SRAMs with resistive defects
COPETTI, THIAGO S.
;
BALEN, TIAGO R.
;
MEDEIROS, GUILHERME C.
;
Letícia Maria Bolzani Pöhls
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Fabian Vargas
1
ADDED, NEMITALA
1
AGUIRRE, FERNANDO
1
Andrea Calimera
1
BALEN, TIAGO R.
1
BRUM, E.
1
COPETTI, THIAGO S.
1
DA SILVEIRA, MARCILEI A. G.
1
DE AGUIAR, VITOR A. P.
1
Dhiego Silva
.
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