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Issue DateTitleAuthor(s)
2017Ionizing radiation effects on a COTS low-cost RISC microcontrollerLEITE, FELIPE G. H.; SANTOS, ROBERTO B. B.; MEDINA, NILBERTO H.; AGUIAR, VITOR. A. P.; GIACOMINI, RENATO C.; ADDED, NEMITALA; AGUIRRE, FERNANDO; MACCHIONE, EDUARDO L.A.; Fabian Luis Vargas; DA SILVEIRA, MARCILEI A. G.
2017Analysis of single-event upsets in a Microsemi ProAsic3E FPGAVILLA, PAULO R. C.; GOERL, ROGER C.; Fabian Luis Vargas; POEHLS, LETICIA B.; MEDINA, NILBERTO H.; ADDED, NEMITALA; DE AGUIAR, VITOR A. P.; MACCHIONE, EDUARDO L. A.; AGUIRRE, FERNANDO; DA SILVEIRA, MARCILEI A. G.; BEZERRA, EDUARDO A.
2016Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TIDJuliano Benfica; GREEN, BRUNO; PORCHER, BRUNO C.; Letícia Maria Bolzani Pöhls; Fabian Vargas; MEDINA, NILBERTO H.; ADDED, NEMITALA; DE AGUIAR, VITOR A. P.; MACCHIONE, EDUARDO L. A.; AGUIRRE, FERNANDO; DA SILVEIRA, MARCILEI A. G.
2018Analysis of conducted-EMI noise influence on the effectiveness of an EDAC technique to mitigate soft errors in ionizing radiation environmentGOERL, ROGER; VILLA, PAULO; Fabian Luis Vargas; MEDINA, NILBERTO H.; ADDED, NEMITALA; DE AGUIAR, VITOR A. P.; DA SILVEIRA, MARCILEI A. G.; Eduardo Bezerra
2017Analysis of COTS FPGA SEU-sensitivity to combined effects of conducted-EMI and TIDVILLA, PAULO; Eduardo Bezerra; GOERL, ROGER; POEHLS, LETICIA; Fabian Luis Vargas; MEDINA, NILBERTO; ADDED, NEMITALA; DE AGUIAR, VITOR; MACCHIONE, EDUARDO; AGUIRRE, FERNANDO; DA SILVEIRA, MARCILEI