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Please use this identifier to cite or link to this item: https://hdl.handle.net/10923/23439
Type: conferenceObject
Title: Applying Memory Test to Embedded Systems
Author(s): César Augusto Missio Marcon
Alexandre Amory
Marcelo Lubaszewski
Altamiro Amadeu Susin
Ney Laert Vilar Calazans
Fernando Gehm Moraes
Fabiano Passuelo Hessel
In: 5th IEEE Latin-American Test Workshop, 2004, Colômbia.
Issue Date: 2004
URI: https://hdl.handle.net/10923/23439
Appears in Collections:Apresentação em Evento

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